| Year | 2013 |
|---|---|
| Authors | Y. S. Huang, Y. C. Lee, S. Y. Hu, C. C. Huang, M. K. Tsai, Y. H. Weng, K. K. Tiong, C. C. Chang |
| Paper Title | Studies of Raman and X-ray diffraction in InGaN films with different In contents |
| Conference Name | 2013 International Symposium on Nano Science and Technology |
| Location | 102207 - Tainan |
| Number Of Authors | 8 |
